Quick Search

Seller Id
Advanced Search
Gift Cards
Checkout a Gift Card

Our secure web pages are hosted by Chrislands Inc, who use a Thawte SSL Certificate to ensure secure transmission of your information.
Fully Trusted SSL Certificate

D.B. Holt And B.G. Yacobi Listings

If you cannot find what you want on this page, then please use our search feature to search all our listings.

Click on Title to view full description

1 D.B. Holt and B.G. Yacobi
Extended Defects in Semiconductors: Electronic Properties, Device Effects, and Structures
Cambridge University Press; Cambridge, UK; 2007; 0521819342 / 9780521819343; First Edition; Hardcover; Brand New; Brand New; 
The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics. A comprehensive survey, in one volume, of extended structural defects in semiconductors Suitable as a reference text for researchers but also as a textbook for graduate students Timely, in view of advances in electronic device development, which involve defect control and engineering at the nanometer level Contents 1. Semiconducting materials; 2. An introduction to extended defects; 3. Characterization of extended defects in semiconductors; 4. Core structures and mechanical effects of extended defects specific to semiconductors; 5. The electrical, optical and device effects of dislocations and grain boundaries; 6. Point defect materials problems. Printed Pages: 644 with 236 line diagrams, 113 half-tones, and 350 figures. 019988

Price: 151.00 USD
Add to Shopping Cart


Questions, comments, or suggestions
Please write to info@mrmlonline.com
Copyright©2018. All Rights Reserved.
Powered by ChrisLands.com